AMAT Applied Materials 0190-16177射頻匹配導(dǎo)航器
1.產(chǎn) 品 資 料 介 紹:
- 寬頻段阻抗動(dòng)態(tài)匹配:支持 13.56MHz、27.12MHz 等半導(dǎo)體常用射頻頻段,適配 0.1-50Ω 寬范圍負(fù)載阻抗變化,匹配速度≤50μs,能快速響應(yīng)等離子體點(diǎn)火、工藝切換等場(chǎng)景下的阻抗突變,確保射頻能量反射系數(shù)(S11 參數(shù))≤0.05(即能量反射率≤2.5%),避免反射功率損壞射頻電源。其匹配原理基于內(nèi)置的可調(diào)電容 / 電感網(wǎng)絡(luò),通過(guò) PID 閉環(huán)控制算法實(shí)時(shí)調(diào)節(jié)元件參數(shù),實(shí)現(xiàn)負(fù)載與電源的阻抗共軛匹配。
- 多維度功率監(jiān)控與調(diào)節(jié):集成高精度功率傳感器(測(cè)量精度 ±0.5% FS),可同時(shí)監(jiān)測(cè)入射功率(0-3000W)、反射功率(0-500W)及駐波比(VSWR)等關(guān)鍵參數(shù);支持功率輸出線(xiàn)性調(diào)節(jié),調(diào)節(jié)步長(zhǎng)≤1W,能根據(jù)工藝需求(如刻蝕深度控制)動(dòng)態(tài)調(diào)整傳遞至等離子體的能量,適配 7nm 及以下先進(jìn)制程對(duì)功率精度的要求。
- GaN 器件集成與高效能設(shè)計(jì):采用第三代半導(dǎo)體 GaN(氮化鎵)功率器件,相比傳統(tǒng) Si 或 GaAs 器件,具備低導(dǎo)通損耗、高功率密度優(yōu)勢(shì),可將匹配系統(tǒng)效率提升至 95% 以上,同時(shí)顯著縮小設(shè)備體積,為工藝腔體周邊的緊湊布局節(jié)省空間。GaN 器件的高溫穩(wěn)定性(工作溫度上限達(dá) 150℃)也使其能適應(yīng)半導(dǎo)體設(shè)備內(nèi)部的嚴(yán)苛熱環(huán)境。
- 智能化協(xié)同與診斷:配備 EtherNet/IP 工業(yè)以太網(wǎng)接口,可無(wú)縫接入 AMAT 設(shè)備主控制系統(tǒng)及工廠(chǎng) MES 系統(tǒng),實(shí)現(xiàn)匹配參數(shù)的遠(yuǎn)程配置與實(shí)時(shí)數(shù)據(jù)上傳;內(nèi)置故障自診斷模塊,能自動(dòng)識(shí)別電容老化、傳感器異常、網(wǎng)絡(luò)通信中斷等 12 類(lèi)常見(jiàn)故障,通過(guò) LCD 顯示屏及聲光報(bào)警系統(tǒng)即時(shí)提示,同時(shí)生成故障代碼便于快速定位維修。
- 工業(yè)級(jí)可靠性設(shè)計(jì):采用金屬屏蔽外殼(材質(zhì)為鋁合金,表面導(dǎo)電氧化處理),電磁兼容性(EMC)符合 IEC 61000-4 標(biāo)準(zhǔn),可有效抵御等離子體設(shè)備產(chǎn)生的強(qiáng)電磁干擾;工作溫度范圍覆蓋 0-70℃,濕度耐受≤85% RH(無(wú)凝露),MTBF(平均無(wú)故障時(shí)間)≥80000 小時(shí),滿(mǎn)足半導(dǎo)體工廠(chǎng)連續(xù)生產(chǎn)需求。
AMAT Applied Materials 0190-16177射頻匹配導(dǎo)航器 英文資料:
1、 Core positioning and system of the product
The 0190-16177 RF matching navigator is a key core component in the RF power control system of semiconductor equipment at Applied Materials Corporation (AMAT), and belongs to the "Plasma Process Power Management" product line. In core processes such as wafer etching and thin film deposition that rely on plasma, the energy output by the RF power supply needs to be accurately matched in order to be efficiently transmitted to the process chamber. This navigator serves as a "power matching center" and is specifically adapted to high-end process equipment such as AMAT Centura and Endura. By adjusting impedance matching parameters in real time, it maximizes the utilization of RF energy and controls process stability. It is a core technology unit that ensures plasma density uniformity and improves chip manufacturing yield.
2、 Analysis of core functions and technical characteristics
Based on the strict requirements of semiconductor plasma technology for RF matching and the industry development trend of RF technology, the core characteristics of this navigator can be accurately disassembled into the following points:
Broadband impedance dynamic matching: supports commonly used semiconductor RF frequency bands such as 13.56MHz and 27.12MHz, adapts to load impedance changes in a wide range of 0.1-50 Ω, with a matching speed of ≤ 50 μ s, and can quickly respond to impedance changes in plasma ignition, process switching, and other scenarios, ensuring that the RF energy reflection coefficient (S11 parameter) is ≤ 0.05 (i.e. energy reflectivity ≤ 2.5%), avoiding damage to the RF power source caused by reflected power. The matching principle is based on the built-in adjustable capacitor/inductor network, which adjusts the component parameters in real time through PID closed-loop control algorithm to achieve impedance conjugate matching between the load and the power supply.
Multi dimensional power monitoring and adjustment: Integrated high-precision power sensors (measurement accuracy ± 0.5% FS) can simultaneously monitor key parameters such as incident power (0-3000W), reflected power (0-500W), and standing wave ratio (VSWR); Support linear adjustment of power output, with an adjustment step size of ≤ 1W. It can dynamically adjust the energy transmitted to the plasma according to process requirements (such as etching depth control), and adapt to the power accuracy requirements of advanced processes of 7nm and below.
GaN device integration and high-performance design: Using third-generation semiconductor GaN (gallium nitride) power devices, compared to traditional Si or GaAs devices, it has the advantages of low conduction loss and high power density, which can improve the efficiency of the matching system to over 95%, while significantly reducing the size of the equipment and saving space for compact layout around the process cavity. The high temperature stability of GaN devices (with an upper operating temperature limit of 150 ℃) also enables them to adapt to the harsh thermal environment inside semiconductor devices.
Intelligent collaboration and diagnosis: equipped with EtherNet/IP industrial Ethernet interface, it can seamlessly connect to AMAT equipment main control system and factory MES system, realizing remote configuration of matching parameters and real-time data upload; Built in fault self diagnosis module, capable of automatically identifying capacitor aging, sensor abnormalities, network communication interruptions, etc
AMAT Applied Materials 0190-16177射頻匹配導(dǎo)航器 產(chǎn)品展示

產(chǎn)品視頻
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