AMAT Applied Materials 03-81729-00激光探測器
1.產(chǎn) 品 資 料 介 紹:
- 高精度光譜響應(yīng):聚焦半導(dǎo)體制造常用激光波段(如紅外或深紫外區(qū)域),參考同類 MCT 紅外探測器的性能指標,其光譜響應(yīng)范圍可能覆蓋 4-12μm,峰值探測率(D*)或達 10?-1011 cm?Hz1/2/W 級別,可實現(xiàn)微弱激光信號的精準捕捉。
- 快速響應(yīng)與低噪聲:針對半導(dǎo)體制造的高速生產(chǎn)需求,響應(yīng)時間或低于 3ns,搭配低噪聲放大電路設(shè)計,能實時反饋激光能量波動,適配晶圓缺陷檢測等高頻次監(jiān)測場景。
- 工業(yè)級環(huán)境適配:采用鋁 + PC 等耐用材質(zhì),工作溫度范圍可能覆蓋 - 20~60℃,濕度耐受≤65% RH,防護等級達 IP65 以上,可適應(yīng)半導(dǎo)體潔凈車間的嚴苛環(huán)境。
- 系統(tǒng)集成兼容性:作為 AMAT 設(shè)備的原裝部件,其接口設(shè)計(如 SMA 射頻輸出)與控制邏輯需與沉積、刻蝕等主設(shè)備無縫銜接,支持設(shè)備整體的自動化調(diào)控。
- 晶圓制造過程監(jiān)測:在化學(xué)氣相沉積(CVD)、物理氣相沉積(PVD)等工藝中,實時監(jiān)測激光干涉信號,分析薄膜厚度與均勻性,確保材料沉積精度。
- 缺陷檢測與計量:配合晶圓檢查設(shè)備,通過激光反射 / 散射信號分析,識別微米級表面缺陷,支撐芯片良率提升,適配人工智能、5G 芯片等高端制造需求。
- 激光光源校準:作為標準探測單元,用于設(shè)備內(nèi)置激光源的能量校準與穩(wěn)定性監(jiān)控,保障刻蝕深度、離子注入劑量等關(guān)鍵工藝參數(shù)的準確性。
AMAT Applied Materials 03-81729-00激光探測器 英文資料:
1、 Core positioning and system of the product
03-81729-00 Laser detector is a key component in the semiconductor manufacturing equipment ecosystem of Applied Materials Company (AMAT), belonging to its core "Inspection and Measurement System" product line. As a precise monitoring unit in the entire process of semiconductor wafer manufacturing, this detector mainly serves the laser signal capture and analysis in chip production, supporting the quality control of multi ring joints from material deposition to etching, and is an important component to ensure chip yield.
2、 Speculation on core functions and technical characteristics
Based on the technical direction of AMAT and the industry standard for laser detectors, this product is likely to have the following characteristics:
High precision spectral response: Focusing on the commonly used laser bands in semiconductor manufacturing (such as infrared or deep ultraviolet regions), referring to the performance indicators of similar MCT infrared detectors, its spectral response range may cover 4-12 μ m, with peak detection rate (D *) or up to 10 ? -10 11 cm · Hz 1/2/W level, which can achieve precise capture of weak laser signals.
Fast response and low noise: Targeting the high-speed production needs of semiconductor manufacturing, the response time may be less than 3ns, coupled with low-noise amplifier circuit design, it can provide real-time feedback on laser energy fluctuations and adapt to high-frequency monitoring scenarios such as wafer defect detection.
Industrial grade environment adaptation: Made of durable materials such as aluminum and PC, the working temperature range may cover -20~60 ℃, the humidity tolerance is ≤ 65% RH, and the protection level is above IP65, which can adapt to the harsh environment of semiconductor cleanrooms.
System integration compatibility: As an original component of AMAT equipment, its interface design (such as SMA RF output) and control logic need to be seamlessly integrated with the main equipment such as deposition and etching, supporting the overall automation control of the equipment.
3、 Typical application scenarios
Based on the core business layout of AMAT, the application of this detector is focused on three major areas:
Wafer manufacturing process monitoring: Real time monitoring of laser interference signals in processes such as chemical vapor deposition (CVD) and physical vapor deposition (PVD), analyzing film thickness and uniformity to ensure material deposition accuracy.
Defect detection and measurement: In conjunction with wafer inspection equipment, micro level surface defects are identified through laser reflection/scattering signal analysis, supporting chip yield improvement and adapting to high-end manufacturing needs such as artificial intelligence and 5G chips.
Laser source calibration: As a standard detection unit, it is used for energy calibration and stability monitoring of the built-in laser source in equipment, ensuring the accuracy of key process parameters such as etching depth and ion implantation dose.
AMAT Applied Materials 03-81729-00激光探測器 產(chǎn)品展示

產(chǎn)品視頻
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| 6ES5704-4CB00 | CACR-SR10SF1BFB | ATCA-4745 |
| 6ES5704-3BC50 | CACR-SR06TZ9SM-Y01A | EPC8-DX66-00-2 |
| 6ES5703-5CC00 | CACR-IR10SE | 115970-010,440 |
| 6ES5703-3CD20 | CACR-IR | 859-8150-002 |
| 6ES5703-1CC01 | CACR-SR44BC!CSY414A | PRE-913423 |
| 6ES5703-1BF00 | CACR-IR010101F | VM7830SYS |
The content is from Ruichang Mingsheng Automation Equipment Co., LTD
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